Electronic Imaging and Analytical Services: Equipment

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SEM S-3500N

The S-3500N SEM is a new SEM series developed by Hitachi using PC controlled electronics. It meets the needs of both conventional and unique variable pressure microscopy. The S-3500N uses Windows 95 to provide user-friendly working environment. The microscope is equipped with a PGT digital EDX detector featuring PTS, YAG backscatter detector, and with a HKL EBSP system. This microscope can resolve 3nm particles at 25kV.

S-4700

The S-4700 is a cold field emission scanning electron microscope developed by Hitachi using PC controlled electronics. The microscope is equipped with GW Electronics Centaurus BEI and a PGT digital EDX detector featuring PTS. The resolution of this microscope is 2.5nm at 1kV, 1.5 nm at 15kV.

JEOL T200

A scanning electron microscope capable of low and intermediate magnification. Suited for beginning instruction.

TEM Hitachi H7000

The H7000 is a high resolution transmission electron microscope capable of 125KV. It can resolve 2A at 100,000X.

Hitachi 600AB

The 600AB is a high resolution electron microscope with diffraction capabilities, 45 degree goniometer stage, 100kV, and an EDX detector. This microscope can resolve 8A at 100,00kV.

XPS Kratos

AXIS 165 and Ultra systems are high performance electron spectrometers combinding state of the art XPS functionality, including superior XPS, micro XPS, and XPS imaging. AXIS 165 present uniquely powerful problem solving capabilities for the widest range of surface analysis applications.

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